Please use this identifier to cite or link to this item: http://ir.futminna.edu.ng:8080/jspui/handle/123456789/9458
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dc.contributor.authorAhmed, Aliyu-
dc.contributor.authorOlaniyi, Olayemi Mikail-
dc.contributor.authorKolo, J. G.-
dc.contributor.authorDurugo, C.-
dc.date.accessioned2021-07-14T18:53:39Z-
dc.date.available2021-07-14T18:53:39Z-
dc.date.issued2016-
dc.identifier.citationAhmed, A., Olaniyi, O. M., Kolo, J.G. and Durugo, C. (2016),” A Multifactor Student Attendance Management System Using Fingerprint Biometrics and RFID Techniques”, International Conference on Information and Communication Technology Applications, Federal University of Technology, Minna, pp69-74en_US
dc.identifier.urihttp://ceur-ws.org/Vol-1830/Paper12.pdf-
dc.identifier.urihttp://repository.futminna.edu.ng:8080/jspui/handle/123456789/9458-
dc.descriptionA Multifactor Student Attendance Management System Using Fingerprint Biometrics and RFID Techniquesen_US
dc.description.abstractAttendance is an important factor for measuring eligibility, commitment and record keeping for assessment of students and employees. Several automated attendance systems have been developed. These systems are mostly based on single factor template based, which pose a security fault line. This paper presents the development of a multifactor attendance system that employs the flexibility of RFID technology and the security of fingerprint biometrics to manage students’ attendance record. Performance evaluation in terms of response time and event using 10 students shows that average execution time of approximately 4.61 seconds could be achieved. Likewise, the system recorded zero percent (0%) of false reject, which tries the system reliability and integrity of the result.en_US
dc.language.isoenen_US
dc.publisherSICT FUTMINNAen_US
dc.subjectRFIDen_US
dc.subjectFingerprint Biometricen_US
dc.subjectCryptographyen_US
dc.subjectAuthenticationen_US
dc.subjectSecurityen_US
dc.titleA Multifactor Student Attendance Management System Using Fingerprint Biometrics and RFID Techniquesen_US
dc.typeArticleen_US
Appears in Collections:Computer Engineering

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